Key Features
Feature |
Benefit |
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Precision-fast Control (Adaptive PFC) system
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Users can adjust the related parameters based on the load characteristics to obtain precision, and fast output characteristics
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Integrated 4-quadrant sourcing and measuring capabilities
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Easily and accurately measure current and voltage using a single Card without the need to manually change any connections
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Measurement range: ±60 V, ±3 A (DC), ±10 A (pulsed)
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Easily LIV sweep test with dual Cards
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Source and measurement resolution down to 100 fA and 100 nV
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Can make low-level measurements using a low-cost High-density PXIe SMU that were previously only possible using a more expensive semiconductor device analyzer.
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Fast measurement
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Up to 1M ADC sampling rate, NPLC and sampling rate optional setting
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Free quick V/I control software/div>
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Can make measurements remotely from a PC without the need to program
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Standard PXIe Module, Applicable to PXIe chassis
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Easily expand to multi-channel and integration into rack and stack systems
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