Key Features
Feature |
Benefit |
|
Built-in DIO
|
Easy to realize the synchronization of SMU4221 and external instrument without additional Synchronous control card
|
|
Integrated 4-quadrant sourcing and measuring capabilities
|
Easily and accurately measure current and voltage using a single Card without the need to manually change any connections
|
|
Measurement range: ±30 V, ±500 mA (DC/Pulsed)
|
Easily LIV sweep test with single Card
|
|
Source and measurement resolution down to 100 pA and 100 μV
|
Can make low-level measurements using a low-cost High-density PXIe SMU that were previously only possible using a more expensive semiconductor device analyzer.
|
|
Fast measurement
|
Up to 500K ADC sampling rate, NPLC and sampling rateoptional setting
|
|
Free quick V/I control software
|
Can make measurements remotely from a PC without the need to program
|
|
Standard PXIe Module, Applicable to PXIe chassis
|
Easily expand to multi-channel and integration into rack and stack systems
|





Reviews
There are no reviews yet.